![[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCs]()
[IEEE 2008 Design, Automation and Test in Europe - Munich, Germany (2008.03.10-2008.03.14)] 2008 Design, Automation and Test in Europe - Test Scheduling for Wafer-Level Test-During-Burn-In of Core-Based SoCsBahukudumbi, Sudarshan; Chakrabarty, Krishnendu; Kacprowicz, Richard · 2008