Power-aware SoC test planning for effective utilization of port-scalable testers
- 期刊名称ACM Transactions on Design Automation of Electronic Systems
- 作者Sehgal, Anuja; Bahukudumbi, Sudarshan; Chakrabarty, Krishnendu
- 卷第13卷
- 期第3期
- 印刷ISSN1084-4309
- 文件大小243.90KB
- 发表时间2008-07-01
- DOI10.1145/1367045.1367062
- 页码1-19
Bitmask aware compression of NISC control wordsBasu, Kanad; Murthy, Chetan; Mishra, Prabhat · Integration, the VLSI Journal · 2013
RATS: Restoration-Aware Trace Signal Selection for Post-Silicon ValidationBasu, Kanad; Mishra, Prabhat · IEEE Transactions on Very Large Scale Integration (VLSI) Systems · 2013
[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Efficient trace data compression using statically selected dictionaryBasu, Kanad; Mishra, Prabhat · 2011
[IEEE 2011 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2011.09.20-2011.09.22)] 2011 IEEE International Test Conference - Efficient combination of trace and scan signals for post silicon validation and debugBasu, Kanad; Mishra, Prabhat; Patra, Priyadarsan · 2011
[IEEE 2013 14th International Workshop on Microprocessor Test and Verification (MTV) - Austin, TX, USA (2013.12.11-2013.12.13)] 2013 14th International Workshop on Microprocessor Test and Verification - Dynamic Selection of Trace Signals for Post-Silicon DebugBasu, Kanad; Mishra, Prabhat; Patra, Priyadarsan; Nahir, Amir; Adir, Alon · 2013
[IEEE 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Huntington Beach, CA, USA (2012.11.9-2012.11.10)] 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Constrained signal selection for post-silicon validationBasu, Kanad; Mishra, Prabhat; Patra, Priyadarsan · 2012
[IEEE 2013 26th International Conference on VLSI Design: concurrently with the 12th International Conference on Embedded Systems - Pune, India (2013.01.5-2013.01.10)] 2013 26th International Conference on VLSI Design and 2013 12th International Conference on Embedded Systems - Observability-aware Directed Test Generation for Soft Errors and Crosstalk FaultsBasu, Kanad; Mishra, Prabhat; Patra, Priyadarsan · 2013