Book reviews
- 期刊名称Impact Assessment and Project Appraisal
- 作者Sánchez, Luis E.; Sánchez, Luis E.; Newsome, David; Morrison-Saunders, Angus
- 卷第28卷
- 期第4期
- 印刷ISSN1461-5517
- 电子ISSN1471-5465
- 文件大小66.92KB
- 发表时间2010-12
- DOI10.3152/146155110X12868988657017
- 页码323-327
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (2002.03.20-2002.03.20)] IEEE-Siberian Conference on Electron Devices and Materials SIBEDEM - 2002 Proceedings (Cat No 02EX529) SIBEDM-02 - IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529)2002
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Generation activity and crystal defects in semiconductor devicesRybchenkov, A.A.; Davydov, V.N. · 2002
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Synergetic features of fast cooling of semiconductor devicesRybehenkov, A.A.; Davydov, V.N. · 2002
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Electronic tool for dry sterilizationOrlikov, N.L.; Orlikov, L.N.; Lapukhin, I.A. · 2002
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Computation of disordered Boolean functionsShidlovskiy, S.V.; Svetlakov, A.A.; Shidlovskiy, V.S. · 2002
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Data migration and interaction of information systemsEmejanov, A.I.; Zhukovskij, O.I. · 2002
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Software and hardware for measurements systemsZaborovsky, A.N.; Danilov, D.O.; Leonov, G.V.; Mescheriakov, R.V. · 2002
[IEEE IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM-2002 - Tomsk, Russia (19-20 March 2002)] IEEE-Siberian Conference on Electron Devices and Materials. SIBEDEM - 2002. Proceedings (Cat. No.02EX529) - Laser frequency converters for Universal Lidar systemGeiko, L.G.; Andreev, Yu.M.; Geiko, P.P. · 2002