SPIE Proceedings [SPIE OPTO - San Francisco, California (Saturday 23 January 2010)] Vertical-Cavity Surface-Emitting Lasers XIV - Advanced characterization techniques for high power VCSELs
- 作者Moench, Holger; Guenter, James K.; Choquette, Kent D.; Baier, Johannes; Gronenborn, Stephan; Kolb, Johanna; Miller, Michael; Pekarski, Pavel; Schemmann, Marcel; Valster, Adriaan
- 卷第7615卷
- 印刷ISSN0277-786X
- 文件大小331.29KB
- 发表时间2010
- DOI10.1117/12.839953
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