![SPIE Proceedings [SPIE Quality Control by Artificial Vision - Gatlinburg, United States (Monday 19 May 2003)] Sixth International Conference on Quality Control by Artificial Vision - Patterned wafer segmentation]()
SPIE Proceedings [SPIE Quality Control by Artificial Vision - Gatlinburg, United States (Monday 19 May 2003)] Sixth International Conference on Quality Control by Artificial Vision - Patterned wafer segmentationBourgeat, Pierrick T.; Tobin, Jr., Kenneth W.; Meriaudeau, Fabrice; Meriaudeau, Fabrice; Tobin, Jr., Kenneth W.; Gorria, Patrick · 2003