[IEEE 2012 International Conference on Selected Topics in Mobile & Wireless Networking (iCOST) - Avignon, France (2012.07.2-2012.07.4)] 2012 International Conference on Selected Topics in Mobile and Wireless Networking - Context-aware mobile services adaptation to dynamic resources. Application to mHealth
- 作者Nageba, Ebrahim; Rubel, Paul; Fayn, Jocelyne
- 文件大小1065.58KB
- 发表时间2012
- DOI10.1109/icost.2012.6271288
- 页码42-47
Evaluation of erbium-doped silicon for optoelectronic applicationsXie, Y. H.; Fitzgerald, E. A.; Mii, Y. J. · Journal of Applied Physics · 1991
CMOS scaling into the 21st century: 0.1 µm and beyondY. Taur; Y. Mii; D. J. Frank; H. Wong; D. A. Buchanan; S. J. Wind; S. A. Rishton; G. A. Sai-halasz; E. J. Nowak · 1995
Observation of Intersubband Absorption in Boron δ-Doped Si LayersPark, J. S.; Karunasiri, R. P. G.; Wang, K. L.; Mii, Y. J.; Murray, J. · MRS Proceedings · 1991
Hole intersubband absorption in δ-doped multiple Si layersPark, J. S.; Karunasiri, R. P. G.; Mii, Y. J.; Wang, K. L. · Applied Physics Letters · 1991
Strain relaxation in Ge0.09Si0.91epitaxial thin films measured by wafer curvatureC. A. Volkert; E. A. Fitzgerald; R. Hull; Y. H. Xie; Y. J. Mii · 1991
Intersubband absorption in Si1−xGex/Si multiple quantum wellsKarunasiri, R. P. G.; Park, J. S.; Mii, Y. J.; Wang, K. L. · Applied Physics Letters · 1990
Totally relaxed GexSi1−x layers with low threading dislocation densities grown on Si substratesE. A. Fitzgerald; Y. Xie; M. L. Green; D. Brasen; A. R. Kortan; J. Michel; Y. Mii; B. E. Weir · 1991
Studies of molecular-beam epitaxy growth of GaAs on porous Si substratesMii, Y. J. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Proximity effect correction for nanolithographyRau, Richard · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1996
Lithography with 157 nm lasersBloomstein, T. M. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1997
X-ray lithographyHeuberger, A. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1988
Resolution limits of optical lithographyOkazaki, Shinji · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Review of scanning force microscopySarid, Dror · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1991
Diamond nanorodsShenderova, O. A.; Padgett, C. W.; Hu, Z.; Brenner, D. W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 2005
Dielectric/semiconductor interfacesWieder, H. H. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1993
Two-dimensional carrier profilingVandervorst, W. · Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures · 1992