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[IEEE 2013 IEEE International Symposium on Circuits and Systems (ISCAS) - Beijing (2013.5.19-2013.5.23)] 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013) - A monitoring circuit for NBTI degradation at 65nm technology node

[IEEE 2013 IEEE International Symposium on Circuits and Systems (ISCAS) - Beijing (2013.5.19-2013.5.23)] 2013 IEEE International Symposium on Circuits and Systems (ISCAS2013) - A monitoring circuit for NBTI degradation at 65nm technology node

Yandong He, ; Jie Hong, ; Ganggang Zhang, ; Lin Han, ; Xing Zhang,

作者Yandong He, ; Jie Hong, ; Ganggang Zhang, ; Lin Han, ; Xing Zhang,
文件大小378.11KB
发表时间2013
DOI10.1109/iscas.2013.6572284
页码2083-2086

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