Control current stress technique for the investigation of gate dielectrics of MIS devicesAndreev, Vladimir V.; Bondarenko, Gennady G.; Maslovsky, Vladimir M.; Stolyarov, Alexander A.; Andreev, Dmitry V. · physica status solidi (c) · 2015

Investigation of Injection- and Radiation-Thermal Processes in Thin Gate Dielectric Films of MIS StructuresAndreev, Dmitrii; Bondarenko, Gennady; Andreev, Vladimir; Stolyarov, Alexander · Key Engineering Materials · 2018

Use of High-Field Electron Injection into Dielectrics to Enhance Functional Capabilities of Radiation MOS SensorsAndreev, Dmitrii V.; Bondarenko, Gennady G.; Andreev, Vladimir V.; Stolyarov, Alexander A. · Sensors · 2020

Modification and reduction of defects in thin gate dielectric of MIS devices by injection-thermal and irradiation treatmentsAndreev, Vladimir V.; Bondarenko, Gennady G.; Maslovsky, Vladimir M.; Stolyarov, Alexander A.; Andreev, Dmitry V. · physica status solidi (c) · 2015

Simulation of charge processes in dielectric films of MIS structures at simultaneous influence by ionization and high-field injection of electronsAndreev, Dmitrii V.; Bondarenko, Gennady G.; Andreev, Vladimir V.; Stolyarov, Alexander A. · Procedia Manufacturing · 2019

[IEEE 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT) - Moscow, Russia (2018.3.14-2018.3.16)] 2018 Moscow Workshop on Electronic and Networking Technologies (MWENT) - Automatized setup for researching of MIS structures under high-field tunnel injection of electrons at stress and measurement conditionsAndreev, Dmitrii V.; Bondarenko, Gennady G.; Andreev, Vladimir V.; Stolyarov, Alexander A. · 2018