[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Characterization and estimation of microsphere-lens misalignment from FTIR response data of microsphere-lens-enhanced MWIR SLS photo detectors
- 作者Megherbi, D. B.; DiZoglio, J.; Vakil, I.; Limberopoulos, N.; Urbas, A.
- 文件大小1236.01KB
- 发表时间2016
- DOI10.1109/NAECON.2016.7856816
- 页码286-291
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Committee2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Front matters2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Author index2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Copyright page2016
[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Table of contents2016
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[IEEE 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Dayton, OH, USA (2016.7.25-2016.7.29)] 2016 IEEE National Aerospace and Electronics Conference (NAECON) and Ohio Innovation Summit (OIS) - Characterization and estimation of microsphere-lens misalignment from FTIR response data of microsphere-lens-enhanced MWIR SLS photo detectorsMegherbi, D. B.; DiZoglio, J.; Vakil, I.; Limberopoulos, N.; Urbas, A. · 2016