SAE Technical Paper Series [SAE International WCX™ 17: SAE World Congress Experience - (APR. 04, 2017)] SAE Technical Paper Series - Comprehensive Diagnostic Methodology
- 作者Chamarthi, Gopal K.; Sarkar, Andrew; Baltusis, Paul; Laleman, Mark
- 卷第1卷
- 印刷ISSNArra-y
- 文件大小6222.53KB
- 发表时间2017
- DOI10.4271/2017-01-1685
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