![SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Diffraction efficiencies of holographic laminar and blazed types gratings for use in a flat-field spectrograph in the 50-200 eV range for transmission electron microscopes]()
SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Diffraction efficiencies of holographic laminar and blazed types gratings for use in a flat-field spectrograph in the 50-200 eV range for transmission electron microscopesImazono, T.; Morawe, Christian; Khounsary, Ali M.; Koike, M.; Kawachi, T.; Goto, Shunji; Koeda, M.; Nagano, T.; Sasai, H.; Oue, Y.; Yonezawa, Z.; Kuramoto, S.; Sano, K. · 2011