[IEEE 2018 IEEE International Reliability Physics Symposium (IRPS) - Burlingame, CA (2018.3.11-2018.3.15)] 2018 IEEE International Reliability Physics Symposium (IRPS) - Biographies
- 文件大小413.46KB
- 发表时间2018
- DOI10.1109/IRPS.2018.8353538
- 页码1-22
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Operation serializability for embedded systemsGupta, R.K. · 1996
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - An automated design environment for micromechanical sensorsMurthi, A.; Rocaries, F. · 1996
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Deterministic test pattern reproduction by a counterKagaris, D.; Tragoudas, S.; Majumdar, A. · 1996
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Realistic fault extraction for boardsSousa, J.T.; Shen, T.; Cheung, P.Y.K. · 1996
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Constructive analysis of cyclic circuitsShiple, T.R.; Berry, G.; Touati, H. · 1996
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Surprises in sequential redundancy identificationIyer, M.A.; Long, D.E.; Abramovici, M. · 1996
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Economics modelling and optimisation of MCM test strategiesDislis, C.; Jalowiecki, I.P. · 1996
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - High rate soft output Viterbi decoderLuthi, E.; Casseau, E. · 1996