A New EMI Modeling Method for Mixed-Mode Noise Analysis in Three-Phase Inverter System
- 期刊名称IEEE Access
- 作者Zhou, Wu; Pei, Xuejun; Xiang, Yangxiao; Kang, Yong
- 卷第8卷
- 电子ISSN2169-3536
- 文件大小6823.48KB
- 发表时间2020
- DOI10.1109/access.2020.2983084
- 页码71535-71547
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Reliability of metamorphic HEMTs on GaAs substratesMarsh, P.F.; Whelan, C.S.; Hoke, W.E.; Leoni, R.E.; Kazior, T.E. · 2001
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Modeling HBT ledge variations for insight into GaAs HBT reliabilityHenderson, T. · 2001
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Getting to zero - methods of reducing defectsRoesch, W.J. · 2001
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Comparative thermal characterizations of GaAs and SiC devicesMittereder, J.A.; Anderson, W.T.; Buot, F.A.; Ioannou, D.E. · 2001
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Reliability issues in GaAs-based devices for space applicationsLeon, R.; Okuno, J.; Ruiz, R.; Gallegos, M.; Vu, D.T. · 2001
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Effect of gate metal on reliability of metamorphic HEMTsDammann, M.; Leuther, A.; Konstanzer, H.; Jantz, W. · 2001
[JEDEC GaAs Reliability Workshop. - Baltimore, MD, USA (21 Oct. 2001)] 2001 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.01TH8602) - Exploring physical mechanisms for sudden beta degradation in GaAs-based HBTsWelser, R.E.; DeLuca, P.M. · 2001