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[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2004.03.11-2004.03.11)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat No 04CH37545) STHERM-04 - Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545)2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2004.03.11-2004.03.11)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat No 04CH37545) STHERM-04 - 2004 PROCEEDINGS, Twentieth IEEE Semiconductor Thermal Measurement and Management Symposium - copywright2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - WelcomeMack, B. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Camera for thermal imaging of semiconductor devices based on thermoreflectanceChristofferson, J.; Shakouri, A. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Temperature measurements of semiconductor devices - a reviewBlackburn, D.L. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Hierarchical thermal modeling for SOI technologyXiu, K.; Ketchen, M. · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (9-11 March 2004)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat. No.04CH37545) - Thermal management of harsh-environment electronicsOhadi, M.; Jianwei Qi, · 2004
[IEEE Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2004.03.11-2004.03.11)] Twentieth Annual IEEE Semiconductor Thermal Measurement and Management Symposium (IEEE Cat No 04CH37545) STHERM-04 - Table of contents2004
Measuring partial thermal resistances in a heat-flow pathRencz, M.R.; Szekely, V. · IEEE Transactions on Components and Packaging Technologies · 2002
Thermal Measurement and Modeling of Multi-Die PackagesPoppe, A.; Yan Zhang, ; Wilson, J.; Farkas, G.; Szabo, P.; Parry, J.; Rencz, M.; Szekely, V. · IEEE Transactions on Components and Packaging Technologies · 2009
Studies on the Nonlinearity Effects in Dynamic Compact Model Generation of PackagesRencz, M.; Szekely, V. · IEEE Transactions on Components and Packaging Technologies · 2004
Increasing the accuracy of structure function based thermal material parameter measurementsRencz, M.; Poppe, A.; Kollar, E.; Ress, S.; Szekely, V. · IEEE Transactions on Components and Packaging Technologies · 2005
[IEEE Comput. Soc. Press European Design and Test Conference - Paris, France (11-14 March 1996)] Proceedings ED&TC European Design and Test Conference - Applied design and analysis of microsystemsKaram, J.M.; Courtois, B.; Poppe, A.; Hofmann, K.; Rencz, M.; Glesner, M.; Szekely, V. · 1996
[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Non-linearity issues in the dynamic compact model generation [package thermal modeling]Rencz, M.; Szekely, V. · 2003
[IEEE Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - San Jose, CA, USA (March 15-17, 2005)] Semiconductor Thermal Measurement and Management IEEE Twenty First Annual IEEE Symposium, 2005. - Thermal characterization of a radial micro-channel cooling plateBognar, Gy.; Horvath, Gy.; Kohari, Zs.; Pang, A.J.; Desmulliez, M.P.Y.; Poppe, A.; Rencz, M.; Szekely, V. · 2005