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[IEEE 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC 2009) - Xi'an (2009.12.25-2009.12.27)] 2009 IEEE International Conference of Electron Devices and Solid-State Circuits (EDSSC) - The effect of the surface recombination on current gain for 4H-SiC BJTYourun Zhang, ; Bo Zhang, ; Zhaoji Li, ; Xiaochuan Deng, ; Xilin liu, · 2009

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