Single-event charge enhancement in SOI devicesMassengill, L.W.; Kerns, E.V., Jr.; Kerns, S.E.; Alles, M.L. · 1990

Oxide interface studies using second harmonic generationN.H. Tolk; M.L. Alles; R. Pasternak; X. Lu; R.D. Schrimpf; D.M. Fleetwood; R.P. Dolan; R.W. Standley · 2007

Radiation effects in new materials for nano-devicesR.D. Schrimpf; D.M. Fleetwood; M.L. Alles; R.A. Reed; G. Lucovsky; S.T. Pantelides · 2011

Effects of fin width on memory windows in FinFET ZRAMsE.X. Zhang; D.M. Fleetwood; M.L. Alles; R.D. Schrimpf; F.E. Mamouni; W. Xiong; S. Cristoloveanu · 2010

Thin BOX SIMOX silicon-on-insulator substrates for radiation tolerent advanced electronicsL.P. Allen; M.L. Alles; R.P. Dolan; H.L. Hughes; P. McMarr · 1997

SPICE analysis of the SEU sensitivity of a fully depleted SOI CMOS SRAM cellAlles, M.L. · IEEE Transactions on Nuclear Science · 1994

Two-dimensional methodology for modeling radiation-induced off-state leakage in CMOS technologiesEsqueda, I.S.; Barnaby, H.J.; Alles, M.L. · IEEE Transactions on Nuclear Science · 2005

Generation smartphoneSiewiorek, Dan · IEEE Spectrum · 2012

The truth about terahertzArmstrong, Carter · IEEE Spectrum · 2012

How RCA Lost the LC DGross, B. · IEEE Spectrum · 2012

Spectral lines: The bankers vs. technologyChristiansen, Donald · IEEE Spectrum · 1977

Networking assets [distributed generation]Sweet, W. · IEEE Spectrum · 2001

Top 10 tech cars [hybrid electric vehiclesVoelcker, J. · IEEE Spectrum · 2005

Countering IEDSZorpette, Glenn · IEEE Spectrum · 2008

Flexible AC transmissionHingorani, N.G. · IEEE Spectrum · 1993