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- 期刊名称Physical Review C
- 作者Dewberry, R. A.; Kouzes, R. T.; Naumann, R. A.
- 卷第27卷
- 期第2期
- 印刷ISSN0556-2813
- 文件大小48.07KB
- 发表时间1983-2-1
- DOI10.1103/PhysRevC.27.892
- 页码892-893
Single-event charge enhancement in SOI devicesMassengill, L.W.; Kerns, E.V., Jr.; Kerns, S.E.; Alles, M.L. · 1990
Oxide interface studies using second harmonic generationN.H. Tolk; M.L. Alles; R. Pasternak; X. Lu; R.D. Schrimpf; D.M. Fleetwood; R.P. Dolan; R.W. Standley · 2007
Radiation effects in new materials for nano-devicesR.D. Schrimpf; D.M. Fleetwood; M.L. Alles; R.A. Reed; G. Lucovsky; S.T. Pantelides · 2011
Effects of fin width on memory windows in FinFET ZRAMsE.X. Zhang; D.M. Fleetwood; M.L. Alles; R.D. Schrimpf; F.E. Mamouni; W. Xiong; S. Cristoloveanu · 2010
Thin BOX SIMOX silicon-on-insulator substrates for radiation tolerent advanced electronicsL.P. Allen; M.L. Alles; R.P. Dolan; H.L. Hughes; P. McMarr · 1997
SPICE analysis of the SEU sensitivity of a fully depleted SOI CMOS SRAM cellAlles, M.L. · IEEE Transactions on Nuclear Science · 1994
Two-dimensional methodology for modeling radiation-induced off-state leakage in CMOS technologiesEsqueda, I.S.; Barnaby, H.J.; Alles, M.L. · IEEE Transactions on Nuclear Science · 2005
Generation smartphoneSiewiorek, Dan · IEEE Spectrum · 2012
The truth about terahertzArmstrong, Carter · IEEE Spectrum · 2012
How RCA Lost the LC DGross, B. · IEEE Spectrum · 2012
Spectral lines: The bankers vs. technologyChristiansen, Donald · IEEE Spectrum · 1977
Networking assets [distributed generation]Sweet, W. · IEEE Spectrum · 2001
Top 10 tech cars [hybrid electric vehiclesVoelcker, J. · IEEE Spectrum · 2005
Countering IEDSZorpette, Glenn · IEEE Spectrum · 2008
Flexible AC transmissionHingorani, N.G. · IEEE Spectrum · 1993