Cumulative author index to volumes 55 to 64
- 期刊名称FEMS Microbiology Letters
- 作者Craig, F
- 印刷ISSN0378-1097
- 文件大小6613.73KB
- 发表时间1989
- DOI10.1016/0378-1097(89)90522-3
- 页码11-111
Thermal heating within SOIKoning, J.J.; Lecaudey, S.; Spaan, E.; Stoutjesdijk, M.; Janssen, J.H.J. · Microelectronics Reliability · 2008
Inside front cover - Editorial boardMicroelectronics Reliability · 2008
RF CMOS reliability simulationsSasse, Guido T.; Acar, Mustafa; Kuper, Fred G.; Schmitz, Jurriaan · Microelectronics Reliability · 2008
EditorialGroeseneken, Guido; Wolf, Ingrid De; Mouthaan, Anton; Bisschop, Jaap · Microelectronics Reliability · 2008
Inside front cover - Editorial boardMicroelectronics Reliability · 2014
Book ReviewNaikan, Vallayil N.A. · Microelectronics Reliability · 2013
Endurance behavior of conductive yarnsde Vries, Hans; Cherenack, Kunigunde H. · Microelectronics Reliability · 2014
Trends in automotive power semiconductor packagingDietrich, Peter · Microelectronics Reliability · 2013