[IEEE 1991 International Conference on Circuits and Systems - Shenzhen, China (16-17 June 1991)] 1991 International Conference on Circuits and Systems - An effective algorithm for test application
- 作者Zhou Zijian, ; Chen Junliang,
- 文件大小298.41KB
- 发表时间1991
- DOI10.1109/ciccas.1991.184444
- 页码663-666
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