![SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - <title>Fast position measurement using CCD</title>]()
SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - <title>Fast position measurement using CCD</title>Yuan, Feng; Ding, Zhen-Liang; Xu, Jun; Jiang, Zuomin; Qiang, Xifu; Zhu, Li · 1993