![[IEEE 1997 21st International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 Sept. 1997)] 1997 21st International Conference on Microelectronics. Proceedings - 2D modelling of mechanical stress evolution and electromigration in confined aluminum interconnects]()
[IEEE 1997 21st International Conference on Microelectronics. Proceedings - Nis, Yugoslavia (14-17 Sept. 1997)] 1997 21st International Conference on Microelectronics. Proceedings - 2D modelling of mechanical stress evolution and electromigration in confined aluminum interconnectsPetrescu, V.; Mouthaan, A.J. · 1997