Materials of a Different Stripe
- 期刊名称Physics Today
- 作者Levi, Barbara Goss
- 卷第51卷
- 期第6期
- 印刷ISSN0031-9228
- 电子ISSN1945-0699
- 文件大小484.18KB
- 发表时间1998-06
- DOI10.1063/1.882269
- 页码22-22
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization -Maex, Karen; De Wolf, Ingrid; Howard, Dave; Steegen, An; Lauwers, Anne · 1998
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Laser microscopy ofIkeda, Kazuto; Kimura, Takahiro; Nakamura, Tomoji · 1998
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Electromigration failures under bidirectional current stressTao, Jiang; Cheung, Nathan W.; Hu, Chenming · 1998
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Barrier layer formation onSekiguchi, Mitsuru; Ueda, Satoshi; Tamaki, Tokuhiko; Mayumi, Shuichi · 1998
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - AC electromigration (10 MHz–1 GHz) in Al metallizationRodbell, K. P.; Castellano, A. J.; Kaufman, R. I. · 1998
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Electromigration behavior of borderless viasKakuhara, Yumi; Chikaki, Shin-ichi · 1998
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - The electromigration force in metallic bulkLodder, A.; Dekker, J. P. · 1998
[ASCE STRESS INDUCED PHENOMENA IN METALLIZATION - Tokyo (Japan) (4-6 Jun 1997)] Fourth international workshop on stress induced phenomena in metallization - Diffusion barriers between Si and CuMori, Hidetsugu; Imahori, Junji; Oku, Takeo; Murakami, Masanori · 1998