Reply to amiodarone and the risk of cancer
- 期刊名称Cancer
- 作者Su, Vincent Yi-Fong; Hu, Yu-Wen; Liu, Chia-Jen
- 印刷ISSN0008-543X
- 文件大小53.70KB
- 发表时间2013-07
- DOI10.1002/cncr.28257
Spectroscopic Ellipsometry for the Characterization of Thin FilmsFerrieu, F. · Journal of The Electrochemical Society · 1990
Spectroscopic ellipsometry of optical transitions in thin strained Si1−xGex filmsF. Ferrieu; F. Beck; D. Dutartre · 1992
A study of Ar implantation induced defects in SiO2R.A.B. Devine; F. Ferrieu; A. Golanski · 1983
Optical characterization of polycrystalline silicon before and after thermal oxidationP. Montaudon; M.H. Debroux; F. Ferrieu; A. Vareille · 1985
In situ ellipsometric control of Si1−xGexSi heterostructures grown by chemical beam epitaxyP. Boucaud; F. Glowacki; F. Ferrieu; A. Larré; A. Perio; D. Bensahel · 1994
In situ spectroscopic ellipsometry: Application to Sb coverage measurement in the monolayer range on Si (111)S. Andrieu; F. Ferrieu; F. Arnaud d'Avitaya · 1989
Recoil implantation of oxygen from SiO2 thin films on siliconB. Villepelet; F. Ferrieu; A. Grouillet; A. Golanski; J.P. Gailliard; E. Ligeon · 1981
NMR shifts of protons in tanol free radical single crystals at 4.2°KF. Ferrieu; M. Nechtschein · 1971
Note: Helical nanobelt force sensorsHwang, G.; Hashimoto, H. · Review of Scientific Instruments · 2012
New ProductsMandelis, Andreas · Review of Scientific Instruments · 2012
New ProductsMandelis, Andreas · Review of Scientific Instruments · 2013
New ProductsMandelis, Andreas · Review of Scientific Instruments · 2013
Compact 1‐GW pulse power sourceIvers, J. D.; Nation, J. A. · Review of Scientific Instruments · 1983
High Speed Optical PyrometerFoley, G. M. · Review of Scientific Instruments · 1970
Inclined straight electrostatic analyzerNandi, T.; Ahmad, Nissar; Singh, Hemant K.; Pillay, R. G. · Review of Scientific Instruments · 2004
Resonance Experiments in Successive Oscillatory FieldsRamsey, Norman F. · Review of Scientific Instruments · 1957