Customer Service in Libraries: Best Practices edited by Charles Harmon and Michael Messina
- 期刊名称Public Services Quarterly
- 作者Jeffryes, Jon
- 卷第9卷
- 期第4期
- 印刷ISSN1522-8959
- 电子ISSN1522-9114
- 文件大小54.36KB
- 发表时间2013-10
- DOI10.1080/15228959.2013.842406
- 页码311-312
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Keynote AddressFields, J. · 2003
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[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Test resource partitioning and optimization for SOC designsLarsson, E.; Fujiwara, H. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Development of energy consumption ratio testXiaoyun Sun, ; Kinney, L.; Vinnakota, B. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Fault testing for reversible circuitsPatel, K.N.; Hayes, J.P.; Markov, I.L. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Layered approach to designing system test interfacesMan Wah Chiang, ; Zilic, Z. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Testing SoC interconnects for signal integrity using boundary scanTehranipour, M.H.; Ahmed, N.; Nourani, M. · 2003
[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Deterministic test vector decompression in software using linear operations [SOC testing]Balakrishnan, K.J.; Touba, N.A. · 2003
Test set embedding for deterministic BIST using a reconfigurable interconnection networkLei Li; Chakrabarty, K. · 2004
[IEEE Design, Automation and Test in Europe - Munich, Germany (07-11 March 2005)] Design, Automation and Test in Europe - Hybrid BIST Based on Repeating Sequences and Cluster AnalysisLei Li, ; Chakrabarty, K. · 2005