Immunopathological Aspects of Experimental Trypanosoma cruzi Reinfections
- 期刊名称BioMed Research International
- 作者Reis Machado, Juliana; Silva, Marcos Vinícius; Borges, Diego Costa; da Silva, Crislaine Aparecida; Ramirez, Luis Eduardo; dos Reis, Marlene Antônia; Castellano, Lúcio Roberto; Rodrigues, Virmondes; Rodrigues, Denise Bertulucci Rocha
- 卷第2014卷
- 印刷ISSN2314-6133
- 电子ISSN2314-6141
- 文件大小3681.43KB
- 发表时间2014
- DOI10.1155/2014/648715
- 页码1-9
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BUCHBESPRECHUNGENtm - Technisches Messen · 1967
Produktinformationen / Product informationtm - Technisches Messen · 1983
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