![Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscope]()
Comparative analysis of methods for measurement of the surface potential of dielectrics charging under electron-beam irradiation in a scanning electron microscopeRau, E. I.; Tatarintsev, A. A.; Kupreenko, S. Yu.; Zaitsev, S. V.; Podbutsky, N. G. · Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques · 2017