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E-field induced keep-out zone determination method of through-silicon vias for 3-D ICs

E-field induced keep-out zone determination method of through-silicon vias for 3-D ICs

Kim, Kibeom; Choi, Junsung; Woo, Seongho; Cho, Jaeyong; Ahn, Seungyoung

期刊名称Microelectronics Reliability
作者Kim, Kibeom; Choi, Junsung; Woo, Seongho; Cho, Jaeyong; Ahn, Seungyoung
卷第98卷
印刷ISSN0026-2714
文件大小778.55KB
发表时间2019-07
DOI10.1016/j.microrel.2019.05.007
页码161-164

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