The Register of Thomas Langley, Bishop of Durham 1406-1437
- 期刊名称Speculum
- 作者Weske, Dorothy Bruce; Storey, R. L.
- 卷第38卷
- 期第1期
- 印刷ISSN0038-7134
- 文件大小229.58KB
- 发表时间1963-01
- DOI10.2307/2851526
SPIE Proceedings [SPIE 1989 Microelectronic Intergrated Processing Conferences - Santa Clara (Tuesday 10 October 1989)] Surface and Interface Analysis of Microelectronic Materials Processing and Growth - <title>Vision Based Instrumentation For Microelectronic Materials Processing</title>Lake, Don W.; Brillson, Leonard J.; Pollak, Fred H. · 1990
SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Microelectronic Processes, Sensors, and Controls - <title>Empirical models in semiconductor processing: optimization and assessment as simulators</title>Lavelle, Steve W.; Wood, David; Hydes, A. J.; Bondur, James A.; Elliott, Kiefer; Hauser, John R.; Kwong, Dim-Lee; Ray, Asit K. · 1994
SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Microelectronic Processes, Sensors, and Controls - <title>Emissivity compensated radiance-contrast-tracking pyrometry for semiconductor processing</title>Adel, Michael E.; Mangan, Shmuel; Ish-Shalom, Yaron; Bondur, James A.; Elliott, Kiefer; Hauser, John R.; Kwong, Dim-Lee; Ray, Asit K. · 1994
SPIE Proceedings [SPIE 1989 Microelectronic Intergrated Processing Conferences - Santa Clara (Tuesday 10 October 1989)] Surface and Interface Analysis of Microelectronic Materials Processing and Growth - <title>Investigation of Copper / Polyimide Interfacial Reactions</title>Nagaraj an, Rao M.; Wells, Victor A.; Brillson, Leonard J.; Pollak, Fred H. · 1990
SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Microelectronic Processes, Sensors, and Controls - <title>Generic operational models and factory control</title>Pratt, Margeret; Bondur, James A.; Elliott, Kiefer; Hauser, John R.; Kwong, Dim-Lee; Ray, Asit K. · 1994
SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Microelectronic Processes, Sensors, and Controls - <title>Comparison of rapid thermal processing and furnace processing for quarter-micrometer CMOS</title>El-Kareh, Badih; Ghatalia, Ashwin; Kellam, Mark D.; Maillot, Philippe; Osburn, Carlton M.; Zhang, Xiaoqiang; Bondur, James A.; Elliott, Kiefer; Hauser, John R.; Kwong, Dim-Lee; Ray, Asit K. · 1994
SPIE Proceedings [SPIE Microelectronic Processing '92 - San Jose, CA (Sunday 20 September 1992)] Rapid Thermal and Laser Processing - <title>Laser engraving</title>Zhang, Bingjun; Su, Baorong; Liu, Yuquan; Kwong, Dim-Lee; Mueller, Heinrich G. · 1993
SPIE Proceedings [SPIE Microelectronic Processing '93 - Monterey, CA (Sunday 26 September 1993)] Microelectronic Processes, Sensors, and Controls - <title>Charge-buildup damage to gate oxide</title>Gabriel, Calvin; Bondur, James A.; Elliott, Kiefer; Hauser, John R.; Kwong, Dim-Lee; Ray, Asit K. · 1994