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Modeling and Experimental Characterization of Metal Microtextured Thermal Interface MaterialsKempers, R.; Lyons, A. M.; Robinson, A. J. · Journal of Heat Transfer · 2013
Experimental Characterization and Modeling of the Thermal Behavior of SiGe HBTsEl Rafei, A.; Saleh, A.; Sommet, R.; Nebus, J.M.; Quere, R. · 2012
Experimental Characterization, Predictive Mechanical and Thermal Modeling of Nanostructures and their Polymer Composites || Index, · 2018
Experimental Characterization, Predictive Mechanical and Thermal Modeling of Nanostructures and their Polymer Composites || Copyright, · 2018
Experimental Characterization, Predictive Mechanical and Thermal Modeling of Nanostructures and their Polymer Composites || ContributorsApuzzo, Andrea · 2018
Experimental Characterization and Modeling of Dry Dual Clutch Thermal Expansion EffectsHoic, Matija; Herold, Zvonko; Kranjcevic, Nenad; Deur, Josko; Ivanovic, Vladimir · SAE International Journal of Passenger Cars - Mechanical Systems · 2013
Experimental Characterization, Predictive Mechanical and Thermal Modeling of Nanostructures and their Polymer Composites || Front Matter, · 2018
Experimental characterization and modeling of thermal resistance of electric machine lamination stacksCousineau, J. Emily; Bennion, Kevin; DeVoto, Douglas; Narumanchi, Sreekant · International Journal of Heat and Mass Transfer · 2019
The development of component-level thermal compact models of a C4/CBGA interconnect technology: the Motorola PowerPC 603 and PowerPC 604 RISC microprocessorsParry, J.; Rosten, H.; Kromann, G.B. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1998
Solder joint reliability of high I/O ceramic-ball-grid arrays and ceramic quad-flat-packs in computer environments: the PowerPC 603/sup TM/ and PowerPC 604/sup TM/ microprocessorsGerke, R.D.; Kromann, G.B. · IEEE Transactions on Components and Packaging Technologies · 1999
[IEEE Comput. Soc. Press 1992 IEEE Multi-Chip Module Conference MCMC-92 - Santa Cruz, CA, USA (18-20 March 1992)] Proceedings 1992 IEEE Multi-Chip Module Conference MCMC-92 - Thermal management for ceramic multichip modules: experimental programKromann, G.B. · 1992
[IEEE 1994 Proceedings. 44th Electronic Components and Technology Conference - Washington, DC, USA (1-4 May 1994)] 1994 Proceedings. 44th Electronic Components and Technology Conference - Thermal modeling and experimental characterization of the C4/surface-mount-array interconnect technologiesKromann, G.B. · 1994
[IEEE 1997 47th Electronic Components and Technology Conference - San Jose, CA, USA (18-21 May 1997)] 1997 Proceedings 47th Electronic Components and Technology Conference - Investigation of heat sink attach methodologies and the effects on package structural integrity and interconnect reliability of the 119-lead plastic ball grid arrayEyman, L.M.; Kromann, G.B. · 1997
[IEEE Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Austin, TX, USA (5-7 March 1996)] Twelfth Annual IEEE Semiconductor Thermal Measurement and Management Symposium. Proceedings - Thermal management of a C4/ceramic-ball-grid array: the Motorola PowerPC 603/sup TM/ and PowerPC 604/sup TM/ RISC microprocessorsKromann, G.B. · 1996
[IEEE 1996 46th Electronic Components and Technology Conference - Orlando, FL, USA (28-31 May 1996)] 1996 Proceedings 46th Electronic Components and Technology Conference - The development of component-level thermal compact models of a C4/CBGA interconnect technology: the Motorola PowerPC 603/sup TM/ and PowerPC 604/sup TM/ RISC microprocessorsParry, J.; Rosten, H.; Kromann, G.B. · 1996
Development of modular productsKusiak, A.; Chun-Che Huang, · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1996
Dynamic manufacturing process controlPearsall, K.; Raines, B. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1994
Electronic Components ObsolescenceCondra, L.W.; Anissipour, A.A.; Mayfield, D.D.; Pecht, M.G. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1997
Nonvolatile MemoryBrewer, J.E. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1997
Semiconductor workbench for integrated modelingWeckman, J. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1994
The benefits of stress testingChan, H.A. · IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1995
[Back cover]IEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1998
Call for papersIEEE Transactions on Components, Packaging, and Manufacturing Technology: Part A · 1998