Digital terrestrial television
- 期刊名称Modern Italy
- 作者Pilati, Antonio; Poli, Emanuela
- 卷第6卷
- 期第2期
- 印刷ISSN1353-2944
- 电子ISSN1469-9877
- 文件大小139.95KB
- 发表时间2001-11
- DOI10.1080/13532940120084116
- 页码195-204
[IEEE Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (1995.11.27-1995.12.1)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA-95 - Author's index1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Poly-3 bitline crack [DRAMs]Tan, W.; Lee Keat Peng, ; Giam Siang Tian, · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Oxidation of copper leadframeAng, G.L.; Goh, L.C.; Heng, K.W.; Lahiri, S.K. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Fault isolation on mixed signal deviceTan, K.T.; Ong, S.H.; Yong, C.T. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability testing of GaAs MMICsAnderson, W.T.; Roussos, J.A.; Christianson, K.A. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - VMESS: VLSI mechanical stress simulatorBhattacharyya, A.B.; Singh, D.N.; Metha, R.; Goswami, I. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IGBT power semiconductor reliability analysis for traction applicationJacob, P.; Held, M.; Scacco, P. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Surface analysis and application in magnetic hard disk mediaGopalakrishnan, R. · 1995