The greening of television
- 期刊名称IEEE Spectrum
- 作者Perry, Tekla
- 卷第47卷
- 期第1期
- 印刷ISSN0018-9235
- 文件大小427.07KB
- 发表时间2010-01
- DOI10.1109/MSPEC.2010.5372490
- 页码26-26
[IEEE Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (1995.11.27-1995.12.1)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA-95 - Author's index1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Poly-3 bitline crack [DRAMs]Tan, W.; Lee Keat Peng, ; Giam Siang Tian, · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Oxidation of copper leadframeAng, G.L.; Goh, L.C.; Heng, K.W.; Lahiri, S.K. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Fault isolation on mixed signal deviceTan, K.T.; Ong, S.H.; Yong, C.T. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability testing of GaAs MMICsAnderson, W.T.; Roussos, J.A.; Christianson, K.A. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - VMESS: VLSI mechanical stress simulatorBhattacharyya, A.B.; Singh, D.N.; Metha, R.; Goswami, I. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IGBT power semiconductor reliability analysis for traction applicationJacob, P.; Held, M.; Scacco, P. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Surface analysis and application in magnetic hard disk mediaGopalakrishnan, R. · 1995