Avoidance of Multiple Pregnancy without Decrease of Pregnancy Rate in ART
- 期刊名称Journal of Mammalian Ova Research
- 作者Shiotani, Masahide; Kokeguchi, Shoji; Matsumoto, Yukiko; Mizusawa, Yuri; Yamada, Satoshi; Ogata, Seiji; Okamoto, Eri; Ogata, Hiromi; Kamino, Motoko; Mizuta, Shinpei; Furuhashi, Koyu; Kataoka, Nobuhiko
- 卷第28卷
- 期第4期
- 印刷ISSN1341-7738
- 电子ISSN1347-5878
- 文件大小887.54KB
- 发表时间2011-10
- DOI10.1274/jmor.28.159
- 页码159-167
[IEEE Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (1995.11.27-1995.12.1)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits IPFA-95 - Author's index1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Poly-3 bitline crack [DRAMs]Tan, W.; Lee Keat Peng, ; Giam Siang Tian, · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Oxidation of copper leadframeAng, G.L.; Goh, L.C.; Heng, K.W.; Lahiri, S.K. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Fault isolation on mixed signal deviceTan, K.T.; Ong, S.H.; Yong, C.T. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Reliability testing of GaAs MMICsAnderson, W.T.; Roussos, J.A.; Christianson, K.A. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - VMESS: VLSI mechanical stress simulatorBhattacharyya, A.B.; Singh, D.N.; Metha, R.; Goswami, I. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - IGBT power semiconductor reliability analysis for traction applicationJacob, P.; Held, M.; Scacco, P. · 1995
[IEEE 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Singapore (27 Nov.-1 Dec. 1995)] Proceedings of 5th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Surface analysis and application in magnetic hard disk mediaGopalakrishnan, R. · 1995