Sub -60-mV/decade Negative Capacitance FinFET with Sub -10-nm Hafnium-Based Ferroelectric CapacitorKo, Eunah; Lee, Hyunjae; Goh, Youngin; Jeon, Sanghun; Shin, Changhwan; Shin, Changhwan · IEEE Journal of the Electron Devices Society · 2017

External Resistor-free Gate Configuration Phase Transition FDSOI MOSFETShin, Jaemin; Shin, Changhwan · IEEE Journal of the Electron Devices Society · 2018

Fermi-Level Unpinning Technique with Excellent Thermal Stability for n-type GermaniumKim, Gwang-Sik; Kim, Seung-Hwan; Lee, Tae In; Cho, Byung Jin; Choi, Changhwan; Shin, Changhwan; Shim, Joon Hyung; Kim, Jiyoung; Yu, Hyun-Yong · ACS Applied Materials & Interfaces · 2017

DIBL improvement in hysteresis-free and ferroelectric-gated FinFETsShin, Jaemin; Shin, Changhwan · Semiconductor Science and Technology · 2019

Simulation Techniques for Nanoelectromechanical (NEM) RelayCho, Karam; Shin, Changhwan · Journal of Nanoscience and Nanotechnology · 2018

DIBL enhancement in ferroelectric-gated FinFETCho, Hyungki; Shin, Changhwan · Semiconductor Science and Technology · 2019

Ferroelectric-Gated Nanoelectromechanical Nonvolatile Memory CellChoe, Kihun; Shin, Changhwan · IEEE Transactions on Electron Devices · 2018

Steep switching devices for low power applications: negative differential capacitance/resistance field effect transistorsKo, Eunah; Shin, Jaemin; Shin, Changhwan · Nano Convergence · 2018

Adaptive recoding CORDICZhang, Jianfeng; Liu, Hengzhu; Hu, Wenmin; Liu, Dongpei; Zhang, Botao · IEICE Electronics Express · 2012

Improved exponential hashingLuo, Wenbin; Heileman, Gregory L. · IEICE Electronics Express · 2004

Miniaturized ultrahigh frequency fundamental quartz resonatorsIwata, Hirokazu · IEICE Electronics Express · 2004

Current status of GaN power devicesKachi, Tetsu · IEICE Electronics Express · 2013

Rectennas for microwave power transmissionShinohara, Naoki · IEICE Electronics Express · 2013

From Editor-in-ChiefIEICE Electronics Express · 2013

Electromechanical theory of microelectromechanical devicesHashiguchi, Gen · IEICE Electronics Express · 2014

From Editor-in-ChiefIEICE Electronics Express · 2014