[IEEE 2019 IEEE/ACM 23rd International Symposium on Distributed Simulation and Real Time Applications (DS-RT) - Cosenza, Italy (2019.10.7-2019.10.9)] 2019 IEEE/ACM 23rd International Symposium on Distributed Simulation and Real Time Applications (DS-RT) - Performance Gains in V2X Experiments Using Distributed Simulation in the Veins Framework
- 作者Gutlein, Moritz; German, Reinhard; Djanatliev, Anatoli
- 文件大小1365.38KB
- 发表时间2019
- DOI10.1109/ds-rt47707.2019.8958671
- 页码1-7
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Foreword2019
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - High Performance Memory RepairMerchant, Feroze; Devarajan, Anandraj; Basu, Anik; Ashen, Dave; Yelton, Brandon; Joshi, Prashant D. · 2019
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Predicting Single Event Effects in DRAMKline, Donald; Longofono, Stephen; Melhem, Rami; Jones, Alex K. · 2019
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Understanding of GPU Architectural Vulnerability for Deep Learning WorkloadsSantoso, Danny; Jeon, Hyeran · 2019
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Co-relation Scan Attack Analysis (COSAA) on AES: A Comprehensive Approach2019
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Testing of In-Memory-Computing 8T SRAMsTsai, Tsai-Ling; Li, Jin-Fu; Hsu, Chun-Lung; Sun, Chi-Tien · 2019
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Efficient Error-Tolerant Quantized Neural Network AcceleratorsGambardella, Giulio; Kappauf, Johannes; Blott, Michaela; Doehring, Christoph; Kumm, Martin; Zipf, Peter; Vissers, Kees · 2019
[IEEE 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Noordwijk, Netherlands (2019.10.2-2019.10.4)] 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Challenges of Reliability Assessment and Enhancement in Autonomous SystemsJenihhin, Maksim; Reorda, Matteo Sonza; Balakrishnan, Aneesh; Alexandrescu, Dan · 2019
ReDO: Cross-Layer Multi-Objective Design-Exploration Framework for Efficient Soft Error Resilient SystemsSavino, Alessandro; Vallero, Alessandro; Di Carlo, Stefano · IEEE Transactions on Computers · 2018
SyRA: Early System Reliability Analysis for Cross-layer Soft Errors Resilience in Memory Arrays of Microprocessor SystemsVallero, Alessandro; Savino, Alessandro; Chatzidimitriou, Athanasios; Kaliorakis, Manolis; Kooli, Maha; Riera Villanueva, Marc; Di Natale, Giorgio; Bosio, Alberto; Canal, Ramon; Gizopoulos, Dimitris; Di Carlo, Stefano · IEEE Transactions on Computers · 2018
Performance Monitor Counters: interplay between safety and security in complex Cyber-Physical SystemsCarelli, Alberto; Vallero, Alessandro; Di Carlo, Stefano · IEEE Transactions on Device and Materials Reliability · 2019
[IEEE 2014 17th Euromicro Conference on Digital System Design (DSD) - Verona, Italy (2014.8.27-2014.8.29)] 2014 17th Euromicro Conference on Digital System Design - Cross-Layer Early Reliability Evaluation for the Computing cOntinuumDi Carlo, Stefano; Vallero, Alessandro; Gizopoulos, Dimitris; Di Natale, Giorgio; Grasset, Arnaud; Mariani, Riccardo; Reichenbach, Frank · 2014
[IEEE 2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) - Cluj-Napoca (2018.5.24-2018.5.26)] 2018 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) - Securing bitstream integrity, confidentiality and authenticity in reconfigurable mobile heterogeneous systemsCarelli, Alberto; Cristofanini, Carlo Alberto; Vallero, Alessandro; Basile, Cataldo; Prinetto, Paolo; Di Carlo, Stefano · 2018
[IEEE 2018 IEEE 36th VLSI Test Symposium (VTS) - San Francisco, CA, USA (2018.4.22-2018.4.25)] 2018 IEEE 36th VLSI Test Symposium (VTS) - Multi-faceted microarchitecture level reliability characterization for NVIDIA and AMD GPUsVallero, Alessandro; Tselonis, Sotiris; Gizopoulos, Dimitris; Di Carlo, Stefano · 2018
[IEEE 2019 IEEE 25th International Symposium on On-Line Testing And Robust System Design (IOLTS) - Rhodes, Greece (2019.7.1-2019.7.3)] 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design (IOLTS) - Bayesian models for early cross-layer reliability analysis and design space explorationVallero, Alessandro; Savino, Alessandro; Carelli, Alberto; Carlo, Stefano Di · 2019
[IEEE 2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS) - Santa Rosa, CA, USA (2017.4.24-2017.4.25)] 2017 IEEE International Symposium on Performance Analysis of Systems and Software (ISPASS) - Microarchitecture level reliability comparison of modern GPU designs: First findingsVallero, Alessandro; Di Carlo, Stefano; Tselonis, Sotiris; Gizopoulos, Dimitris · 2017