Book reviews
- 期刊名称The Analyst
- 作者Crews, H. M.; Haskins, N. J.; Magill, T.; Belton, P. S.; Maddams, W. F.; O'Haver, T. C.; Newman, E. J.; Lloyd, G. O.; Corbett, J. K.; Wilburn, F. W.; Herod, A. A.; Clark, Brian J.; O'Kennedy, Richard; Egan, Denise; Cass, A. E. G.; Straw, W. A.; Hall, Gwendy E. M.; Fogg, Arnold; Masson, Mary; Seitz, W. Rudolf; Blezard, R. G.; Hitchcock, C.; Brereton, R. G.; Loadman, M. J. R.; Ersser, R. S.; Simpson, D.; Blanchflower, W. J.; Taylor, C. D.; Watts, C. D.; Pungor, Erno; Wilson, I. D.; Ramsey, Michael H.; Dong, Deming; Rennie, P. J.
- 卷第117卷
- 期第7期
- 印刷ISSN0003-2654
- 电子ISSN1364-5528
- 文件大小2786.62KB
- 发表时间1992
- DOI10.1039/an9921701197
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Digital Maintenance Information (DMI) systemKnapp, P.M. · 1989
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - The integrated support station (ISS): a modular Ada-based test system to support AN/ALE-47 countermeasure dispenser system testing, evaluation, and reprogrammingValentino, G.J. · 1989
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - A digital maintenance information (DMI) system for ATELanders, T.; Nguyen, M.; Delgado, R. · 1989
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Interfacing to boundary scan chips for system level BITTurino, J. · 1989
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - System engineering considerations and methodology for effecting a cohesive functional/parametric testing strategyGranieri, M.N. · 1989
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Optical system spectral transmission measurements in the visible and infraredMei, E.Y.C.; Gallinger, D.A. · 1989
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - System level BIT: a tool for MATE test station self maintenanceSeeger, J.M. · 1989
[IEEE IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Philadelphia, PA, USA (25-28 Sept. 1989)] IEEE Automatic Testing Conference.The Systems Readiness Technology Conference. Automatic Testing in the Next Decade and the 21st Century. Conference Record. - Measuring system performance characteristics of infrared systems (MRT, MTF, NETD) using automatic test equipmentRosell, F.A.; Gibson, L. · 1989
CorrespondenceT. Harris; Julius Grant; Ordway Hilton; D.M. Ellen; Alistair R. Brownlie · 1979
Infrared spectra of adsorbed propyneD.M. Smith; J.R. Brainard; M.E. Grant; C.A. Lieder · 1974
Diamond and Diamond Like Carbon CoatingsMcColl, I.R.; Wood, J.V.; Grant, D.M. · Transactions of the IMF · 1994
Gene therapy in transplantationJerome M. Laurence; Richard D.M. Allen; Geoffrey W. McCaughan; Grant J. Logan; Ian E. Alexander; G. Alex Bishop; Alexandra F. Sharland · 2009
The gamma phase of CaNi5+H2J.J. Murray; D.M. Grant; E. Akiba; M.L. Post · 1986
A simple test for acetylator phenotype using caffeineD.M. Grant; B.K. Tang; W. Kalow · 2004
Hydrogen in 304 steel: Diffusion, permeation and surface reactionD.M. Grant; D.L. Cummings; D.A. Blackburn · 1987
Nuclear envelope morphology in Galeolaria caespitosa eggs (Serpulidae, polychaeta)N.J. Grant; D.M. Dwarte · 1969