![[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A concurrent bist scheme for on-line/off-line testing based on a pre-computed test set]()
[IEEE IEEE International Conference on Test, 2005. - Charlotte, NC, USA (Nov. 8, 2005)] IEEE International Conference on Test, 2005. - A concurrent bist scheme for on-line/off-line testing based on a pre-computed test setVoyiatzis, I.; Gizopoulos, D.; Paschalis, A.; Halatsis, C. · 2005