[IEEE 2015 IEEE 8th International Conference on Cloud Computing (CLOUD) - New York City, NY, USA (2015.6.27-2015.7.2)] 2015 IEEE 8th International Conference on Cloud Computing - A Trust and Reputation System for Energy Optimization in Cloud Data Centers
- 作者Aransay, Ignacio; Zapater, Marina; Arroba, Patricia; Moya, Jose M.
- 文件大小401.82KB
- 发表时间2015
- DOI10.1109/CLOUD.2015.28
- 页码138-145
Field-emission scanning probe lithography tool for 150 mm waferHolz, Mathias; Guliyev, Elshad; Ahmad, Ahmad; Ivanov, Tzvetan; Reum, Alexander; Hofmann, Martin; Lenk, Claudia; Kaestner, Marcus; Reuter, Christoph; Lenk, Steve; Rangelow, Ivo W.; Nikolov, Nikolay · Journal of Vacuum Science & Technology B · 2018
Nanofabrication by field-emission scanning probe lithography and cryogenic plasma etchingLenk, Claudia; Hofmann, Martin; Lenk, Steve; Kaestner, Marcus; Ivanov, Tzvetan; Krivoshapkina, Yana; Nechepurenko, Diana; Volland, Burkhard; Holz, Mathias; Ahmad, Ahmad; Reum, Alexander; Wang, Chen; Jones, Mervyn; Durrani, Zahid; Rangelow, Ivo W. · Microelectronic Engineering · 2018
Scanning probe-based high-accuracy overlay alignment concept for lithography applicationsIshchuk, Valentyn; Guliyev, Elshad; Aydogan, Cemal; Buliev, Ivan; Kaestner, Marcus; Ivanov, Tzvetan; Ahmad, Ahmad; Reum, Alexander; Lenk, Steve; Lenk, Claudia; Nikolov, Nikolay; Glinsner, Thomas; Rangelow, Ivo W. · Applied Physics A · 2017
Large area fast-AFM scanning with active “Quattro” cantilever arraysAhmad, Ahmad; Nikolov, Nikolay; Angelov, Tihomir; Ivanov, Tzvetan; Reum, Alexander; Atanasov, Ivaylo; Guliyev, Elshad; Ishchuk, Valentyn; Kaestner, Marcus; Krivoshapkina, Yana; Lenk, Steve; Lenk, Claudia; Rangelow, Ivo W.; Holz, Mathias · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2016
Atomic force microscope integrated with a scanning electron microscope for correlative nanofabrication and microscopyRangelow, Ivo W.; Kaestner, Marcus; Ivanov, Tzvetan; Ahmad, Ahmad; Lenk, Steve; Lenk, Claudia; Guliyev, Elshad; Reum, Alexander; Hofmann, Martin; Reuter, Christoph; Holz, Mathias · Journal of Vacuum Science & Technology B · 2018
Sharp GaN nanowires used as field emitter on active cantilevers for scanning probe lithographyLenk, Claudia; Hofmann, Martin; Ivanov, Tzvetan; Ahmad, Ahmad; Lenk, Steve; Rangelow, Ivo W.; Reum, Alexander; Reuter, Christoph; Holz, Mathias; Behzadirad, Mahmoud; Rishinaramangalam, Ashwin K.; Feezell, Daniel; Busani, Tito · Journal of Vacuum Science & Technology B · 2018
Pattern-generation and pattern-transfer for single-digit nano devicesRangelow, Ivo W.; Ahmad, Ahmad; Ivanov, Tzvetan; Kaestner, Marcus; Krivoshapkina, Yana; Angelov, Tihomir; Lenk, Steve; Lenk, Claudia; Ishchuk, Valentyn; Hofmann, Martin; Nechepurenko, Diana; Atanasov, Ivaylo; Volland, Burkhard; Guliyev, Elshad; Durrani, Zahid; Jones, Mervyn; Wang, Chen; Liu, Dixi; Reum, Alexander; Holz, Mathias; Nikolov, Nikolay; Majstrzyk, Wojciech; Gotszalk, Teodor; Staaks, Daniel; Dallorto, Stefano; Olynick, Deirdre L. · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2016
Six-axis AFM in SEM with self-sensing and self-transduced cantilever for high speed analysis and nanolithographyAngelov, Tihomir; Ahmad, Ahmad; Guliyev, Elshad; Reum, Alexander; Atanasov, Ivaylo; Ivanov, Tzvetan; Ishchuk, Valentyn; Kaestner, Marcus; Krivoshapkina, Yana; Lenk, Steve; Lenk, Claudia; Rangelow, Ivo W.; Holz, Mathias; Nikolov, Nikolay · Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena · 2016