The ribonucleic acid of potato yellow dwarf virus
- 作者Guy S. Reeder; Dennis L. Knudson; Roderick MacLeod
- 卷第50卷
- 期第1期
- 文件大小1351.58KB
- 发表时间1972
- DOI10.1016/0042-6822(72)90378-9
- 页码301-304
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - Implant dosimetry results for plasma dopingWalther, S.; Lenoble, D.; Ziwei Fang, ; Liebert, R.B. · 2000
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - Two implant measurement of pressure compensation factorsHalling, M. · 2000
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - Implant dosimetry results for plasma dopingWalther, S.; Lenoble, D.; Ziwei Fang, ; Liebert, R.B. · 2000
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - Junction capacitance reduction by S/D junction compensation implantCurello, C.; Rengarajan, R.; Faul, J.; Kieslich, A.; Glawischnig, H. · 2000
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - How to monitor a sub-keV USJ implantBayha, B.; Loeffelmacher, D.; Lerch, W.; Downey, D.F.; Arevalo, E.A. · 2000
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - Junction capacitance reduction by S/D junction compensation implantCurello, C.; Rengarajan, R.; Faul, J.; Kieslich, A.; Glawischnig, H. · 2000
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - How to monitor a sub-keV USJ implantBayha, B.; Loeffelmacher, D.; Lerch, W.; Downey, D.F.; Arevalo, E.A. · 2000
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - Implant charging dependence on photo resist bake and electron flood gunRomig, T.; King Chao, ; Rendon, M.J.; Azrack, M. · 2000
Cerebral amyloid deposition and diffuse plaques in ``normal'' aging: Evidence for presymptomatic and very mild Alzheimer's diseaseMorris, J. C.; Storandt, M.; McKeel, D. W.; Rubin, E. H.; Price, J. L.; Grant, E. A.; Berg, L. · Neurology · 1996
Doctors and OverpopulationAnderson, J. A. D.; Briggs, J. C.; Butterfield, W. J. H.; Carter, C. O.; Dodd, N.; Dove, G. A. W.; Dunlop, D.; Edmunds, P. N.; Fairweather, D. V. I.; Fletcher, C. M.; Fletcher, R. F.; Gillie, A.; Guillebaud, J.; Holmes, J. M.; Horder, J. P.; Horsey, P. J.; Jain, S.; Johnstone, J. S.; Kay, C. R.; Kerslake, D. M.; Lester, J. P.; Loraine, J. A.; Luder, J.; Lusty, T. D.; MacDonald, N.; McEwan, J.; MacLaren, D. M.; MacNaughton, M. C.; Maneksha, S.; Mears, E.; Morgan, D. A.; Morris, G. M.; Neill, J. G.; Newman, L. T.; Owen, D. A. Ll.; Pemberton, J.; Pickering, G.; Rawson, M. D.; Rubin, S. G.; Rudd, A. S.; Schopflin, K. E.; Slater, E. T. O.; Smith, M. V.; Steiner, E. M.; Stuttaford, I. T.; Swyer, G. I. M.; Tonge, V.; Trafford, J. A. P.; Tuck, M. E.; Tuck, S. C.; Venning, G. R.; Winstanley, M. P. · BMJ · 1972
Curiosity at Gale Crater, Mars: Characterization and Analysis of the Rocknest Sand ShadowBlake, D. F.; Morris, R. V.; Kocurek, G.; Morrison, S. M.; Downs, R. T.; Bish, D.; Ming, D. W.; Edgett, K. S.; Rubin, D.; Goetz, W.; Madsen, M. B.; Sullivan, R.; Gellert, R.; Campbell, I.; Treiman, A. H.; McLennan, S. M.; Yen, A. S.; Grotzinger, J.; Vaniman, D. T.; Chipera, S. J.; Achilles, C. N.; Rampe, E. B.; Sumner, D.; Meslin, P.- Y.; Maurice, S.; Forni, O.; Gasnault, O.; Fisk, M.; Schmidt, M.; Mahaffy, P.; Leshin, L. A.; Glavin, D.; Steele, A.; Freissinet, C.; Navarro-Gonzalez, R.; Yingst, R. A.; Kah, L. C.; Bridges, N.; Lewis, K. W.; Bristow, T. F.; Farmer, J. D.; Crisp, J. A.; Stolper, E. M.; Des Marais, D. J.; Sarrazin, P.; Agard, C.; Alves Verdasca, J. A.; Anderson, R.; Anderson, R.; Archer, D.; Armiens-Aparicio, C.; Arvidson, R.; Atlaskin, E.; Atreya, S.; Aubrey, A.; Baker, B.; Baker, M.; Balic-Zunic, T.; Baratoux, D.; Baroukh, J.; Barraclough, B.; Bean, K.; Beegle, L.; Behar, A.; Bell, J.; Bender, S.; Benna, M.; Bentz, J.; Berger, G.; Berger, J.; Berman, D.; Blanco Avalos, J. J.; Blaney, D.; Blank, J.; Blau, H.; Bleacher, L.; Boehm, E.; Botta, O.; Bottcher, S.; Boucher, T.; Bower, H.; Boyd, N.; Boynton, B.; Breves, E.; Bridges, J.; Brinckerhoff, W.; Brinza, D.; Brunet, C.; Brunner, A.; Brunner, W.; Buch, A.; Bullock, M.; Burmeister, S.; Cabane, M.; Calef, F.; Cameron, J.; Cantor, B.; Caplinger, M.; Rodriguez, J. C.; Carmosino, M.; Blazquez, I. C.; Charpentier, A.; Choi, D.; Clark, B.; Clegg, S.; Cleghorn, T.; Cloutis, E.; Cody, G.; Coll, P.; Conrad, P.; Coscia, D.; Cousin, A.; Cremers, D.; Cros, A.; Cucinotta, F.; d'Uston, C.; Davis, S.; Day, M.; Juarez, M. d. l. T.; DeFlores, L.; DeLapp, D.; DeMarines, J.; Dietrich, W.; Dingler, R.; Donny, C.; Drake, D.; Dromart, G.; Dupont, A.; Duston, B.; Dworkin, J.; Dyar, M. D.; Edgar, L.; Edwards, C.; Edwards, L.; Ehlmann, B.; Ehresmann, B.; Eigenbrode, J.; Elliott, B.; Elliott, H.; Ewing, R.; Fabre, C.; Fairen, A.; Farley, K.; Fassett, C.; Favot, L.; Fay, D.; Fedosov, F.; Feldman, J.; Feldman, S.; Fitzgibbon, M.; · Science · 2013
[IEEE 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 - Alpbach, Austria (17-22 Sept. 2000)] 2000 International Conference on Ion Implantation Technology Proceedings. Ion Implantation Technology - 2000 (Cat. No.00EX432) - Technical and economic considerations for retrograde well and channel implantsMorris, W.; Rubin, L. · 2000
[IEEE 2004 IEEE International Reliability Physics Symposium. - Phoenix, AZ, USA (25-29 April 2004)] 2004 IEEE International Reliability Physics Symposium. Proceedings - The influence of heavily doped buried layer implants on electrostatic discharge (ESD), latchup, and a silicon germanium heterojunction bipolar transistor in a BiCMOS SiGe technologyVoldman, S.; Lanzerotti, L.; Morris, W.; Rubin, L. · 2004
[IEEE 1998 International Conference on Ion Implantation Technology. Proceedings. Ion Implantation Technology - 98 - Kyoto, Japan (22-26 June 1998)] 1998 International Conference on Ion Implantation Technology. Proceedings (Cat. No.98EX144) - Superior latch-up resistance of high dose, high energy implanted p/sup +/ buried layersLeong, K.C.; Liu, P.C.; Morris, W.; Rubin, L.; Gan, C.H.; Chan, L. · 1998
ERF mutations reveal a balance of ETS factors controlling prostate oncogenesisBose, Rohit; Karthaus, Wouter R.; Armenia, Joshua; Abida, Wassim; Iaquinta, Phillip J.; Zhang, Zeda; Wongvipat, John; Wasmuth, Elizabeth V.; Shah, Neel; Sullivan, Patrick S.; Doran, Michael G.; Wang, Ping; Patruno, Anna; Zhao, Yilin; Robinson, Dan; Van Allen, Eliezer M.; Wu, Yi-Mi; Schultz, Nikolaus; Lonigro, Robert J.; Mosquera, Juan-Miguel; Montgomery, Bruce; Taplin, Mary-Ellen; Pritchard, Colin C.; Attard, Gerhardt; Beltran, Himisha; Abida, Wassim; Bradley, Robert K.; Vinson, Jake; Cao, Xuhong; Vats, Pankaj; Kunju, Lakshmi P.; Hussain, Maha; Tomlins, Scott A.; Cooney, Kathleen A.; Smith, David C.; Brennan, Christine; Siddiqui, Javed; Mehra, Rohit; Chen, Yu; Rathkopf, Dana E.; Morris, Michael J.; Solomon, Stephen B.; Durack, Jeremy C.; Reuter, Victor E.; Gopalan, Anuradha; Gao, Jianjiong; Loda, Massimo; Lis, Rosina T.; Bowden, Michaela; Balk, Stephen P.; Gaviola, Glenn; Sougnez, Carrie; Gupta, Manaswi; Yu, Evan Y.; Mostaghel, Elahe A.; Cheng, Heather H.; Mulcahy, Hyojeong; True, Lawrence D.; Plymate, Stephen R.; Dvinge, Heidi; Ferraldeschi, Roberta; Flohr, Penny; Miranda, Susana; Zafeiriou, Zafeiris; Tunariu, Nina; Mateo, Joaquin; Perez-Lopez, Raquel; Demichelis, Francesca; Robinson, Brian D.; Schiffman, Marc; Nanus, David M.; Tagawa, Scott T.; Sigaras, Alexandros; Eng, Kenneth W.; Elemento, Olivier; Sboner, Andrea; Heath, Elisabeth I.; Scher, Howard I.; Pienta, Kenneth J.; Kantoff, Philip; de Bono, Johann S.; Rubin, Mark A.; Nelson, Peter S.; Garraway, Levi A.; Sawyers, Charles L.; Chinnaiyan, Arul M.; Zheng, Deyou; Schultz, Nikolaus; Sawyers, Charles L. · Nature · 2017